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| X射线荧光光谱分析空气滤膜颗粒物中多种元素 |
| Determination of Many Elements in Particulate Matters on Air Filter Membrane by X-ray Fluorescence Spectrum |
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| 中文摘要: |
| 采用X射线荧光光谱分析空气滤膜采集悬浮颗粒物中的多种元素，样品不需要前处理，不使用试剂，测量1个样品中40余种元素约耗时1 h。重复测量10次NIST SRM 2783空气滤膜标准样品，多数元素的测量值与标准值基本一致，测量值的标准偏差较小；测量20个空气滤膜实际样品，并与ICP-MS法作比对，大多数元素两种方法测量结果的相对偏差较小，测量值基本一致。 |
| 英文摘要: |
| Elements of suspension particles on air filter membrane were detected by using X ray fluorescence spectrum analysis instrument. The membrane sample did not need reagent and treatment. An hour was spent to detected one sample for more than 40 kinds of element contents. Standard samples of NIST SRM 2783 air filter membrane were repeatedly detected 10 times to find that measured values of most elements same as the standard values, and standard deviation of measured values was small. Detected results of 20 air filter membrane samples by the analysis Instrument were similar to results detected by ICP-MS, and both standard deviation of measured values by the two methods were small. |
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